The surface was subsequently reintroduced into the UHV chamber F

The surface was subsequently reintroduced into the UHV chamber. Figure 1 The method how fabricating graphene-oxide-like (GOx) surface. The scheme indicates that the fabrication of the GOx surfaces using benzoic acid. Aniline (Sigma Aldrich, purity, 99.9%) was purified by turbo pumping to remove impurities prior to dosing onto the GOx surfaces. A direct doser, controlled by means of a variable leak valve, was used to dose the substrates. Raman spectra of the samples were collected using a home-built system equipped with an Ar+ ion laser (Spectra-Physics

Stabilite 2017, Santa Clara, CA, USA) as an excitation source; a spectrometer (Horiba Jobin Yvon TRIAX 550, Kyoto, Japan), and a CCD detector (Horiba Jobin Yvon Symphony) cooled to 140 K. The wavelength of the incident excitation beam was 514.5 nm. HRPES experiments Selleckchem Trametinib were performed at the 8A2 beamline at the Pohang Accelerator Laboratory, which was equipped with an electron analyzer (SES100, Gamma Data Scienta, Uppsala, Sweden). The N 1 s core-level spectrum was obtained using photon energies of 460 eV. Secondary electron emission spectra (−20 V sample bias) and valence band spectra were measured at photon energies of 80 eV. The binding energies of the core-level spectra PSI-7977 were determined with respect to the binding energies of the clean Au 4f core level and the

valence band (Fermi energy) for the same photon energy. All spectra were recorded in the normal emission mode. The photoemission spectra were carefully analyzed using a PI3K/Akt/mTOR inhibitor standard nonlinear least-squares fitting procedure with Voigt functions [17]. Results and discussion Raman spectroscopy, which is sensitive Carbachol to the chemical functional groups on a surface, is a useful tool for comparing the properties of the EG and GOx surfaces. Optical microscopy images of the EG (a) and GOx (b) surfaces were acquired, and their corresponding Raman spectra at two positions (over a particle and over the bottom region) were collected, as shown in Figure  2. Figure  2a shows the optical microscopy image of the EG surface grown on a 6H-SiC(0001) substrate. The EG surface appeared clean, with a few small particles remaining

(not oxide). The conditions of the surfaces were assessed by collecting the Raman spectra in a bottom region (marked (A)) and at a particle (marked (B)). A comparison of the D and G Raman bands revealed similar spectra that were characteristic of the EG surface. Note that the G band values (1,597.6 cm–1 and 1,597.9 cm–1) were indistinguishable from the G band position of graphene. The ratio of the D and G band intensities, ID/IG, corresponded to the average value for graphene. The Raman D/G intensity ratios at both the bottom and small particle positions on the EG surface were 0.73, indicating that the surface properties at either position were typical of an EG surface [16]. Figure 2 The micro optical images obtained by the Raman spectra.

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